P.L.E. Uslenghi: Introduction
F.M. Tesche, C. M. Butler: Recent results on the extensions of the BLT
Coupling to cables
Y. Bayram, J. L. Volakis: RF Coupling to Cable Bundles
J.C. Pincenti, P.L.E. Uslenghi: Incident Field Coupling to Random Cable Bundles
Coupling into cavities
C. Lertsirimit, D. R. Jackson, D.R. Wilton, D. Erricolo, D.H-.Y. Yang: Coupling to a Printed Circuit Board Inside a Cavity from a Wire Penetrating an Aperture
C. M. Butler, J.C. Young, C. H. Bopp III: Analysis of Transient Signals in Complex Cavities
Effects of propagation paths
A. Q. Martin, C. Sreerama, V. Ramani: Signal Effects Due to Propagation Through Cavities with Perturbations
M. A. Bridgwood: Susceptibility of Digital IC’s
H.Y. David Yang: High-Power RF Interference on Electronics Circuits
A. C. Cangellaris and E. Michielssen: Analysis of Distributed ICs with Nonlinear Loads
P. Mazumder, B. Wang: Circuit Failure Analysis due to High Failure Analysis due to High Power EMI Noise Power EMI Noise
S. Dutt Students, H. Arslan, F. Trovo, F. Rota: Detection, Classification & Tolerance of EM-Induced Computer Faults
E. S. Siah, T. Yang, J.L. Volakis: Frequency Domain Analysis
E. Michielssen, A. Cangellaris, J. Jin: Fast Time-Domain Integral Equation Solvers for EMC/EMI analysis
P. Mazumder: VEDICS: a variable-mesh electromagnetics-based device and interconnect simulator
D. Erricolo, P.L.E. Uslenghi, M.D. Lockard, C.M. Butler: Validation of computer codes
E. S. SIah, V.V. Liepa, D. Erricolo, J.L. Volakis: Validations and measurements